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rectangular microchannel  (VitroCom Inc)

 
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    VitroCom Inc rectangular microchannel
    Rectangular Microchannel, supplied by VitroCom Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/rectangular+microchannel/rectangular+microchannel/pm32292942-146-5-18
    Average 90 stars, based on 1 article reviews
    rectangular microchannel - by Bioz Stars, 2026-09
    90/100 stars

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    Related Articles

    other:

    Article Title: Monitoring the two-dimensional concentration profile of toluene vapors by using polymer-stabilized nematic liquid crystals in microchannels.
    Article Snippet: Many volatile organic compounds (VOCs) are hazardous to human health and their concentrations need to be monitored over a large area.. However, most chemical sensors can only be used for point detection.. In this paper, we report a method to obtain a two-dimensional (2D) concentration profile of toluene vapor by using polymer-stabilized liquid crystals (PSLCs).

    Concentration Assay:

    Article Title: Vertical focusing and cell ordering in a microchannel via viscoelasticity: Applications for cell monitoring using a digital holographic microscopy
    Article Snippet: .. We performed vertical concentration of microparticles in a rectangular microchannel (width W1⁄4 500 lm, height H1⁄4 50 lm; Vitrocom). .. The working viscoelastic fluid was an aqueous solution of 8%-wt polyvinylpyrrolidone (PVP, Mw1⁄4 360 kDa; Sigma-Aldrich), which is elasticity dominant.



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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    Image Search Results


    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, microchannel plate.

    Journal: Nature Materials

    Article Title: Probing lithium mobility at a solid electrolyte surface

    doi: 10.1038/s41563-023-01535-y

    Figure Lengend Snippet: a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, microchannel plate.

    Article Snippet: The beam was dispersed using a diffraction grating with 1,200 grooves mm –1 before collection on a microchannel plate detector (Rectangular, Hamamatsu Photonics) coated with CsI.

    Techniques: Battery